Simplifying Post-Silicon Timing Diagnosis with NGSPA Tool

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Post-silicon Timing Diagnosis Made
Post-silicon Timing Diagnosis Made
Simple using Formal Technology
Simple using Formal Technology
 
Daher Kaiss, Jonathan Kalechstain
 
Formal Engines and Technologies Team
Core CAD Technologies
Intel Corp. - Haifa
 
Agenda
 
Motivation
 
Speed path debug at Intel
 
Introducing our tool: NGSPA
Next Generation Speed Path Analyzer
 
Results
 
Challenges and next steps
Static Timing Analysis
 
An important pre-silicon design activity
 
Pros:
 Aims to compute the expected timing to a
digital circuit without requiring simulation
 
Cons:
 miscorrelation between the pre. and post silicon
behaviors
usage of simplified delay models:
limited ability to consider the effects of logical interactions
between signals
 
Result:
 about 5% of the chip frequency is achieved by
post silicon speed path debug
Post-silicon Speed Debug
 
Time consuming process
Hundreds of speed paths for some chips
 
Based on Laser Assisted Device Alternation
(LADA)
Costly machines 
(>$1 Million per machine
)
Requires skilled operators
Serial process
Some units might be burnt/broken
 
TTM requirements sometimes cause projects to
go with low GHz
How it was done so far
 
Debug
Each
Failure
 
Collect
All
Failures
Validation
Si. Debug
Bug Fix
Timing Domains
A 
timing domain
 is a set of HW devices controlled
by a common clock
Combinatorial
Block
Combinatorial
Block
Combinatorial
Block
SRC clock domain
DST clock domain
 
Optical Probing
What is NGSPA?
 
N
N
ext 
ext 
G
G
eneration 
eneration 
S
S
peed 
peed 
P
P
ath 
ath 
A
A
nalyzer
nalyzer
A new CAD tool for preforming speed path isolation
A new CAD tool for preforming speed path isolation
Enables replacing >$1M optical probing (LADA) machines
Enables replacing >$1M optical probing (LADA) machines
with CAD application running on a $1K x86 server
with CAD application running on a $1K x86 server
 
Saving machine cost
Saving machine operators resource
From serial LADA execution 
 
Parallelized CAD
From burnt/broken units 
 Deterministic SW
 
Inputs to NGSPA
 
Gate level schematic model (Structural Verilog)
 
A trace produced by simulating a trace on the RTL
Either RTL simulation (~overnight)
Or, Emulation trace (~2 hours)
 
Failing scan and failing cycle
 
Path length
10-20 cycles
 
Source and Destination timing domains
CORE
How it works
Block1
SRC
Block2
Block3
Block4
DST
Block5
Block6
CORE
A
B
Failing
Scanout
SRC
Domain
DST
Doamin
A speed path
Scan
Inputs
SRC
domain
DST
domain
 
Not widely inserted
 
Our approach for isolating speed paths
 
Reproduce the 
functional behavior
 of the speed
path
Instead of silicon debug, we use the logical model of the
design
 
Assumptions:
The speed path was triggered by a 
logic transition 
at
one
 of the sequentials in the source domain
Using SAT for Backward
propagation
 
1
 
0
 
X
 
0
 
1
 
0
 
1
 
 
X
 
1
 
 
X
 
1
 
 
X
 
0
 
Finding Speed paths
Scan
Scan
SRC
SRC
SRC
Inp1
 
[v
0
,v
1
,…, v
j, ..
 v
k
]
 
[?,?,…, NOT v
j, ..
 ?]
Inp2
Scan
Scan
Scan
DST
DST
 
Scan
 
SRC
 
SRC
 
SRC
 
Inp1
 
Inp2
 
Scan
 
Scan
 
Scan
 
DST
 
DST
 
Scan
 
First Challenge: Reconverging logic
 
In a more general way
 
SRC
 
Scan
f
 
Handling Reconverging Paths
 
Scan
f
 
Scan
f
 
SRC
 
SEL-1
 
Mutex (SEL-2, SEL-3)
Second Challenge: Dealing with complexity
Block1
SRC
Block2
Block3
Block4
DST
Block5
Block6
CORE
A
B
 
Iterative Cone Expansion
Iterative Cone Expansion
j-4
j-3
j-2
j-1
j
j
j
 
Failing Scan
j
 
Results
How speed paths looks like
 
SRC
 
DST
 
SRC
 
DST
 
SRC
 
SRC
 
DST
 
SRC
 
S
 
B
 
A
 
Results
Progress so far
 
>90% of the optical probing activity was saved
 
One of two LADA machines in the debug lab will
be released
 
Work on progress deployment this technology
across Intel
 
Limitations:
No failing scan was detected, despite the fact that the
test failed
Future work
 
Can we drop the need for RTL
simulation/emulation and use scan dump traces
only?
Pros: faster TAT
Cons: less observability
 
Use same technology for yield analysis
 
Summary
 
NGSPA is one of the great examples
demonstrating the glory of formal verification
Ability to replace laser based machines with CAD
 
Same technology can be applied to other
adjacent areas like : fault isolation & glitch
detection
 
Formal technologies (SAT and SMT) are being
deployed in other interesting areas in Intel
Tester scheduling, layout routing and filling and others
 
Thank You
Thank You
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Explore how the NGSPA tool by Intel simplifies post-silicon timing diagnosis, replacing costly machines with a CAD application running on an x86 server, saving resources and enabling parallelized CAD operations. Learn about the challenges in post-silicon speed debugging, the importance of static timing analysis, and the process of isolating speed paths for efficient debugging. Discover how NGSPA revolutionizes speed path isolation, making the process faster, more cost-effective, and deterministic.

  • Post-Silicon Timing Diagnosis
  • NGSPA Tool
  • Intel
  • Static Timing Analysis
  • Speed Path Debugging

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  1. Post-silicon Timing Diagnosis Made Simple using Formal Technology Daher Kaiss, Jonathan Kalechstain Formal Engines and Technologies Team Core CAD Technologies Intel Corp. - Haifa

  2. Agenda Motivation Speed path debug at Intel Introducing our tool: NGSPA Next Generation Speed Path Analyzer Results Challenges and next steps

  3. Static Timing Analysis An important pre-silicon design activity Pros: Aims to compute the expected timing to a digital circuit without requiring simulation Cons: miscorrelation between the pre. and post silicon behaviors usage of simplified delay models: limited ability to consider the effects of logical interactions between signals Result: about 5% of the chip frequency is achieved by post silicon speed path debug

  4. Post-silicon Speed Debug Time consuming process Hundreds of speed paths for some chips Based on Laser Assisted Device Alternation (LADA) Costly machines (>$1 Million per machine) Requires skilled operators Serial process Some units might be burnt/broken TTM requirements sometimes cause projects to go with low GHz

  5. How it was done so far Validation Reproduce the Failure Debug Each Failure Failures to Debug Isolate and Id Speedpath Si. Debug Collect All Failures Probing ZBB ed Failures Bug Fix

  6. Timing Domains A timing domain is a set of HW devices controlled by a common clock Combinatorial Block Combinatorial Block Combinatorial Block DST clock domain SRC clock domain Optical Probing

  7. What is NGSPA? Next Generation Speed Path Analyzer A new CAD tool for preforming speed path isolation Enables replacing >$1M optical probing (LADA) machines with CAD application running on a $1K x86 server NGSPA Optical Probing Saving machine cost Saving machine operators resource From serial LADA execution Parallelized CAD From burnt/broken units Deterministic SW

  8. Inputs to NGSPA Gate level schematic model (Structural Verilog) A trace produced by simulating a trace on the RTL Either RTL simulation (~overnight) Or, Emulation trace (~2 hours) Failing scan and failing cycle Path length 10-20 cycles Source and Destination timing domains

  9. How it works Failing Scanout CORE CORE A B Block1 SRC Block2 Block4 DST Block5 Block6 Block3 SRC Domain DST Doamin

  10. A speed path SRC domain DST domain Scan Inputs Not widely inserted

  11. Our approach for isolating speed paths Reproduce the functional behavior of the speed path Instead of silicon debug, we use the logical model of the design Assumptions: The speed path was triggered by a logic transition at one of the sequentials in the source domain

  12. Using SAT for Backward propagation X 1 0 X 1 1 X 1 1 0 0 X 0

  13. Finding Speed paths Scan SRC Scan Scan DST Scan [v0,v1, , vj, .. vk] Scan SRC DST SRC Inp1 Inp2 Same inputs with same values Stimuli from Trace Same free inputs Scan SRC Scan Scan DST Scan [?,?, , NOT vj, .. ?] Scan SRC Only one selector is high DST SRC Inp1 Inp2 Flipping Scanat scanout_phase(=j)

  14. First Challenge: Reconverging logic [F] [F] A Out [F] [T]

  15. In a more general way Scan f SRC

  16. Handling Reconverging Paths Scan f SRC Scan SEL-2 f SEL-1 SEL-3 Mutex (SEL-2, SEL-3)

  17. Second Challenge: Dealing with complexity CORE A B Block1 SRC Block2 Block4 DST Block5 Block6 Block3

  18. Iterative Cone Expansion

  19. Iterative Cone Expansion Failing Scan j j j j-1 j-2 j j-3 j-4

  20. Results Test No. # signals in cone # of inputs on oundary # of latches in cone # of econverg. signals # of iterations path length (in phases) # of paths Run Time (Sec.) 248 278 214 290 186 227 222 745 7168 434 318 442 222 6458 3395 242 5555 619 579 1713 3285 780 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 296 509 405 305 248 517 497 1528 27696 3025 2403 1798 855 25895 21864 855 1545 837 4665 8789 26226 4931 26 67 54 19 11 50 83 212 3009 617 345 258 164 7279 4618 164 303 90 704 994 4035 675 2 14 3 3 1 14 4 59 635 43 22 58 8 294 165 8 46 39 106 125 168 167 4 11 12 0 0 26 3 86 8569 650 209 236 27 1070 2266 27 5 29 1149 2132 2422 689 5 6 11 6 1 55 7 14 31 15 12 33 8 30 33 8 12 23 31 26 27 27 3 4 8 4 1 44 4 8 16 8 7 20 5 16 18 5 6 12 18 14 14 14 1 1 1 1 1 1 1 1 1 2 2 2 3 3 3 4 5 6 7 7 15 40

  21. How speed paths looks like SRC DST SRC S SRC DST SRC DST A B SRC

  22. Results 30 7.0 6.0 25 # of days 5.0 20 # of speed paths 4.0 15 3.0 10 LADA 2.0 NGSPA 5 1.0 Day per speed path 0 0.0 A0 B0 P0 C0 Stepping/Spin

  23. Progress so far >90% of the optical probing activity was saved One of two LADA machines in the debug lab will be released Work on progress deployment this technology across Intel Limitations: No failing scan was detected, despite the fact that the test failed

  24. Future work Can we drop the need for RTL simulation/emulation and use scan dump traces only? Pros: faster TAT Cons: less observability Use same technology for yield analysis

  25. Summary NGSPA is one of the great examples demonstrating the glory of formal verification Ability to replace laser based machines with CAD Same technology can be applied to other adjacent areas like : fault isolation & glitch detection Formal technologies (SAT and SMT) are being deployed in other interesting areas in Intel Tester scheduling, layout routing and filling and others

  26. Thank You

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