Analysis of Resolution and Residuals in Experimental Data

This document presents an analysis of experimental data including resolution figures, residuals from fitting, and positional jitter. It explores single point analysis, charge references, and resolution as a function of sample number. The data is thorough and detailed, providing insights into the accuracy and consistency of the measurements.

• Analysis
• Resolution
• Experimental Data
• Jitter
• Fitting

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1. 3-BPM resolution Resol2_0db (11/12/14) G. Christian 19/1/15

2. Single point analysis (sample 1/10) All data Position - IPA Position - IPB 0.5 4.5 4 0 3.5 -0.5 3 Offset / m Offset / m -1 2.5 2 -1.5 1.5 -2 1 0.5 -2.5 Position - IPC 0 100 200 300 400 500 600 700 800 900 1000 0 100 200 300 400 500 600 700 800 900 1000 41 40 39 Offset / m 38 37 36 35 0 100 200 300 400 500 600 700 800 900 1000

3. Single point analysis (sample 1/10) All data - charge Reference /cnts Reference - diode -3050 300 -3100 250 -3150 200 -3200 -3250 150 -3300 100 -3350 50 -3400 -3450 0 0 100 200 300 400 500 600 700 800 900 1000 -3450 -3400 -3350 -3300 -3250 cnts -3200 -3150 -3100 -3050 Mean = 3290 , Sigma = 50

4. Resolution Residuals (fitting) IPA Resolution Residuals from Least Squares Fitting IPB Resolution Residuals from Least Squares Fitting 300 300 : -0.01 : 0.13 : 0.01 : 0.12 250 250 200 200 150 150 100 100 50 50 0 -0.4 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 0.4 0.5 0.6 0 Size of Residuals / m -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 IPC Resolution Residuals from Least Squares Fitting Size of Residuals / m residuals versus time 300 0.6 : -0.01 : 0.17 0.5 250 0.4 200 0.3 0.2 150 0.1 0 100 -0.1 -0.2 50 -0.3 0 -0.4 -0.6 -0.4 -0.2 0 0.2 0.4 0.6 0.8 0 100 200 300 400 500 600 700 800 900 1000 Size of Residuals / m

5. Sigma #uncut Position Jitter /um BPM Cor R vlaue Res (fit) /nm Res (geom) /um 2.61+/-0.02 -0.84+/-0.01 38.47+/-0.03 0.55+/-0.01 0.42+/-0.01 0.84+/-0.02 0.86 (1,2) -0.31 (1,3) 0.06 (2,3) 126+/-3 124+/-3 170+/-4 All 988 178 2.61+/-0.02 -0.84+/-0.02 38.45+/-0.03 0.54+/-0.01 0.42+/-0.01 0.81+/-0.02 0.87 -0.36 0.09 78+/-2 77+/-2 86+/-2 1 707 133 2.61+/-0.03 -0.84+/-0.02 38.48+/-0.04 0.55+/-0.02 0.42+/-0.02 0.79+/-0.03 0.88 -0.42 0.05 52+/-2 52+/-2 54+/-2 0.5 394 116 2.60+/-0.06 -0.86+/-0.04 38.4+/-0.1 0.52+/-0.04 0.38+/-0.03 0.85+/-0.07 0.83 -0.49 0.07 35+/-3 35+/-3 36+/-3 0.1 76 104 2.57+/-0.07 -0.90+/-0.05 38.4+/-0.1 0.49+/-0.05 0.31+/-0.03 0.91+/-0.09 0.77 -0.64 -0.03 34.9+/-0.4 34.9+/-0.4 35.5+/-0.4 0.05 47 105 2.4+/-0.2 -0.80+/-0.09 39.1+/-0.2 0.5+/-0.1 0.28+/-0.7 0.6+/-0.1 0.95 -0.90 -0.74 29+/-7 29+/-7 31+/-7 0.01 9 79

6. Jitter as fn of sample no 1 Mean position as fn of sample no IPA 40 IPB IPC IPA 0.9 30 IPB IPC 20 0.8 10 0.7 0 0.6 -10 -20 0.5 -30 0.4 -40 -50 1 2 3 4 5 6 7 8 9 10 1 2 3 4 5 6 7 8 9 10 Resolution as fn of sample # 0.5 IPA IPB IPC 0.45 0.4 0.35 0.3 0.25 0.2 0.15 0.1 0 2 4 6 8 10 12

7. 20/12/14 0dB dataset Resol8 (ATF2 FB OFF)

10. Position as a funtion of sample no from peak Jitter as a funtion of sample no from peak 160 14 IPA IPA 140 IPB IPC IPB IPC 12 120 10 100 Position / m 8 80 Jitter / m 60 6 40 4 20 2 0 -20 0 0 5 10 15 20 25 30 0 5 10 15 20 25 30 charge as function of sample no -2800 600 -2850 500 -2900 400 -2950 300 -3000 200 -3050 100 -3100 -3150 0 0 200 400 600 800 1000 1200 1400 1600 1800 2000 -3150 -3100 -3050 -3000 -2950 -2900 -2850 -2800

11. Resolution all charge data Resolution as function of sample no 0.3 IPA IPB IPC 0.25 0.2 m Resolution / 0.15 Fitting Geom 0.1 52nm 52nm 57nm 54nm 0.05 3 4 5 6 7 8 9 10 11

12. Resolution 0.1 sigma cut on charge (163/2001 pulses remaining) Resolution as function of sample no 4 IPA IPB IPC 3.5 3 2.5 m Resolution / 2 1.5 1 0.5 Resolution as function of sample no 0.35 IPA 0 IPB IPC 0 5 10 15 20 25 30 35 0.3 0.25 m 0.2 Resolution / Fitting Geom 0.15 47nm 47nm 51nm 51nm 0.1 0.05 3 4 5 6 7 8 9 10 11

13. Resolution all charge, mean of samples 3 - 10 : -0.00 : 0.04 IPB Resolution Residuals from Least Squares Fitting IPA Resolution Residuals from Least Squares Fitting 500 500 : 0.00 : 0.04 450 450 400 400 350 350 300 300 250 250 200 200 150 150 100 100 50 50 0 -0.2 -0.15 -0.1 -0.05 0 0.05 0.1 0.15 0 Size of Residuals / m -0.2 -0.15 -0.1 -0.05 0 0.05 0.1 0.15 IPC Resolution Residuals from Least Squares Fitting Size of Residuals / m 500 : 0.00 : 0.05 450 400 350 Fitting Geom 300 42nm 42nm 47nm 55nm 250 200 0.1 sigma cut + averaging 150 100 Fitting Geom 50 42nm 42nm 46nm 59nm 0 -0.2 -0.15 -0.1 -0.05 0 0.05 0.1 0.15 Size of Residuals / m