Wenxin Wang EUDET Annual Workshop 2010 Data Analysis Results
Wenxin Wang presented data analysis results at the EUDET Annual Workshop in 2010, showcasing testing and measurements of various modules and panels for TPC systems. The results include drift velocity measurements, comparisons of resistive ink and Kapton materials, and analysis of the Pad Response Function. The presentation highlighted experimental data compared to simulations, providing insights into gas properties and module performance.
Download Presentation
Please find below an Image/Link to download the presentation.
The content on the website is provided AS IS for your information and personal use only. It may not be sold, licensed, or shared on other websites without obtaining consent from the author. Download presentation by click this link. If you encounter any issues during the download, it is possible that the publisher has removed the file from their server.
E N D
Presentation Transcript
D. Atti, P. Colas, M. Dixit, M. Riallot, YunHa Shin, S. Turnbull, W. Wang and all the LC-TPC collaboration 29/09/2010 Wenxin.Wang_EUDET annual workshop 1
From December 2008 to March 2010 we tested 5 panels. One module was installed in the centre of the Large Prototype each time 29/09/2010 Wenxin.Wang_EUDET annual workshop 2
Micromegas Modules for TPC 2 Resistive Kapton ~3 M / Resistive Kapton ~5 M / Standard Resistive ink ~3 M / 29/09/2010 Wenxin.Wang_EUDET annual workshop 3
December 2009: tested modules 4 and 5 without magnetic field. March 2010: tested modules 2 (ink) and 3 (kapton) with 1T magnetic field. June-July 2010: taken data in a high intensity hadron beam at CERN. 29/09/2010 Wenxin.Wang_EUDET annual workshop 4
29/09/2010 Wenxin.Wang_EUDET annual workshop 5
Data analysis results (B=0T) Drift Velocity in T2K gas compared to Magboltz simulations for - P=1035 hPa - T=19 C - 35 ppm H20 ( T2K gas: Ar:CF4:iso=95:3:2) 9 Vd (cm/ s) 8 7 6 5 4 Simulations (Magboltz) 3 2 Measurements 1 0 0 100 200 300 400 Vdrift = 7.698 +- 0.040 cm/ s at E=230 V/cm (Magboltz : 7.583+-0.025(gas comp.)) The difference is 1.5+-0.6 % Ed (V/cm) B=0 data : Drift velocity measurements 29/09/2010 Wenxin.Wang_EUDET annual workshop 6
Data analysis results PRF : Pad Response Function a measure of signal size as a function of track position relative to the centre of the pad The PRF: is not Gaussian. can be characterized by its FWHM (z) & base Width (z), plus another shape parameter. 29/09/2010 Wenxin.Wang_EUDET annual workshop 7
Data analysis results ~ 2.6 mm ~ 10 mm ~ 4 mm ~ 14 mm B=1T data : comparison of resistive ink and Carbon-loaded Kapton PRF(Pad Response Functions) fits, z ~ 5 cm 29/09/2010 Wenxin.Wang_EUDET annual workshop 8
Bias 50 m 50 m Bias after Bias before Bias due to non-uniformity can be easily corrected. 29/09/2010 Wenxin.Wang_EUDET annual workshop 9
Data analysis results Position residuals xrow-xtrack 29/09/2010 Wenxin.Wang_EUDET annual workshop 10
Uniformity Z=5cm MEAN RESIDUAL vs ROW number Z-independent distortions Z=35cm Distortions up to 50 microns for resistive ink (blue points) Rms 7 microns for CLK film (red points) Z=50cm 29/09/2010 Wenxin.Wang_EUDET annual workshop 11
Uniformity (B = 0T) Preliminary Using cosmic-ray Total charge by row using cosmic-ray events 29/09/2010 Wenxin.Wang_EUDET annual workshop 12
Data analysis results (B = 0T & 1T) Carbon-loaded kapton resistive foil C 2 z 2 = + d 0 N eff B=0 T Cd= 315.1 m/ cm (Magboltz) B=1 T Cd= 94.2 m/ cm (Magboltz) 2: Ndf: Module 3 29.1 11 2: Ndf: 10.6 10 Module 4 29/09/2010 Wenxin.Wang_EUDET annual workshop 13
Neffmeasurement with Micromegas Averaging B=0T data and B=1T data (excluding ink module): Neff = 38.0 0.2(stat) 0.8 (Cd syst) 0= 59 3 m Note that 1/<1/N> = 47.1 from Heed for 5 Gev electrons on 6.84 mm long pads. This demonstrates that gain fluctuations are not exponential (Neff would be 23) but smaller. 1/<1/N> = 34.9 for 5.4 mm pads (GEM case). 29/09/2010 Wenxin.Wang_EUDET annual workshop 14
Conclusions A lot of experience has been gained in building and operating Micromegas TPC panels The uniformity of the detector is excellent, with no distortions nor edge effects, and very small dead areas The measured resolution meets LC needs : 60 microns at zero drift distance with 3 mm wide pads The effective number of electrons per row is measured to be 38. Next step is to equip the whole endplate with full integration of the electronics flat behind the panels 29/09/2010 Wenxin.Wang_EUDET annual workshop 15
Thank you 29/09/2010 Wenxin.Wang_EUDET annual workshop 16
