Double Patterning Lithography Techniques

Double Patterning
Samuel Johnson
11/6/18
Outline
Background
Introduction to SADP
Deposition
Trim mask issue
Self Aligned Quadruple Patterning
SADP Problems
Via Level Manufacturing
2
Single Patterning
Lithography and Etch
-
Lay photoresist
-
Lithography
-
Develop
Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing
3
Single Patterning Resolution Limit
-
Theoretical Limit at 36nm
-
Formula is for half pitch: full pitch is 80nm
https://http://www.aspdac.com/
aspdac2013/archive/pdf/3C-
4.pdf/
4
Two Lithography Double Patterning
Litho-etch-Litho-Etch
Litho-freeze-Litho-Etch
Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing
5
Two Lithography Double Patterning
Problems
-
Expensive: two lithography steps
-
Overlay problem
https://semiengineering.com/fillcut-self-aligned-double-patterning/
6
Self Aligned Double Patterning
Nakatama, K; et al. SPIE 2012
7
Conformal Deposition
Step 3: Deposition of sidewall material
Thickness of deposited layer is crucial
Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing
8
Chemical Vapor Deposition (CVD)
Deposition method of choice
-
Able to deposit on resist material and wafer
-
High quality
-
Anisotropic process
-
Industrially viable
Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing
9
Chemical Vapor Deposition (CVD)
CVD is simple and cheap
High temperature
Meets criteria listed before
10
Etching
Etch time and conditions will determine material etched
-
Etching too long will result in different sized features
https://semiengineering.com/fillcut-self-aligned-double-patterning/
11
Trim Mask Issue
Sidewall forms all around patterns-loops
A problem if not desired
Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing
12
Trim Masks
Use another lithography step to get rid of undesired
material
-
Second mask
-
Only use to get rid of unnecessary patterns
 
 
 
https://ieeexplore.ieee.org/document/7723830
13
Trim Masks
Overlay becomes a problem
-
Alignment of the second mask becomes a consideration
https://ieeexplore.ieee.org/document/7723830
14
Trim Masks
Second SADP Lithography step is simpler than a second
LELE Lithography step
-
Cheaper
-
Less Critical
https://semiengineering.com/self-aligned-double-patterning-part-one/
15
Self Aligned Quadruple Patterning
“Double SADP”
Doubles resolution
Two trim lithography steps
Nakatama, K; et al. SPIE 2012
16
Self Aligned Quadruple Patterning
Nakatama, K; et al. SPIE 2012
17
SADP Problems
Not all patterns can be printed
Primary and secondary patterns can’t touch
https://http://www.aspdac.com/aspdac2013/archive/pdf/3C-4.pdf/
18
SADP Problems
Anti-parallel line ends
-
Trim masks overlap if they are too close
https://ieeexplore.ieee.org/document/7723830
19
SADP Problems
Turns are difficult to control
-
Unideal patterning results
https://ieeexplore.ieee.org/document/7723830
20
SADP Problems-Via Manufacturing
Via manufacturing with SADP or single patterning is not
possible
-
Requires another double lithography technique
https://ieeexplore-ieee-org.ezproxy.lib.utexas.edu/document/7940014
21
Via Manufacturing
Double manufacturing with half absorbance
The common exposed areas are fully exposed
22
Via Manufacturing
After etching, unexposed areas form holes
Holes can be filled with a conductive via material
23
Via Manufacturing
Via connects different layers of materials
Other layers formed from other types of patterning
24
In Practice
25
Conclusions
SADP along with other multiple patterning techniques will
continue to be useful
-
Combination of multiple patterning techniques
Design considerations will dominate what manufacturing
method is used
Future innovations in multiple patterning are required to
continue Moore’s Law until NGL’s are feasible
26
 
Questions?
27
References
Self-Aligned Double Patterning Lithography Aware Detailed Routing With Color Preassignment - IEEE
Journals & Magazine
, ieeexplore.ieee.org/document/7723830.
Self-Aligned Double Patterning-Aware Detailed Routing with Double via Insertion and via Manufacturability
Consideration - IEEE Conference Publication
, ieeexplore.ieee.org/document/7544285.
“Fill/Cut Self-Aligned Double-Patterning.” 
Semiconductor Engineering
, semiengineering.com/fillcut-self-
aligned-double-patterning/.
Mack, Chris. “Lecture 59 (CHE 323) Lithography Double Patterning.” 
YouTube
, YouTube, 8 Nov. 2013,
www.youtube.com/watch?v=Foush3X7dCc.
Nakayama, Koichi, et al. “Self-Aligned Double and Quadruple Patterning Layout Principle.” 
Search the
World's Largest Collection of Optics and Photonics Applied Research.
, International Society for Optics and
Photonics, 14 Mar. 2012, www.spiedigitallibrary.org/conference-proceedings-of-spie/8327/83270V/Self-
aligned-double-and-quadruple-patterning-layout-principle/10.1117/12.916678.full.
“Self-Aligned Double Patterning, Part One.” 
Semiconductor Engineering
, semiengineering.com/self-aligned-
double-patterning-part-one/.
“Triple Patterning and Self-Aligned Double Patterning (SADP).” 
Tech Design Forum Techniques
,
www.techdesignforums.com/practice/guides/triple-patterning-self-aligned-double-patterning-sadp/.
28
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Explore the world of lithography with a focus on double patterning techniques. From self-aligned double patterning to chemical vapor deposition methods, this comprehensive overview covers the key concepts, challenges, and solutions in advanced semiconductor manufacturing processes. Dive into the intricacies of lithography steps, resolution limits, and conformal depositions to gain insights into the cutting-edge technologies shaping the semiconductor industry.

  • Lithography Techniques
  • Double Patterning
  • Semiconductor Manufacturing
  • Chemical Vapor Deposition
  • Resolution Limits

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  1. Double Patterning Samuel Johnson 11/6/18

  2. Outline Background Introduction to SADP Deposition Trim mask issue Self Aligned Quadruple Patterning SADP Problems Via Level Manufacturing 2

  3. Single Patterning Lithography and Etch - Lay photoresist - Lithography - Develop 3 Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing

  4. Single Patterning Resolution Limit - Theoretical Limit at 36nm - Formula is for half pitch: full pitch is 80nm https://http://www.aspdac.com/ aspdac2013/archive/pdf/3C- 4.pdf/ 4

  5. Two Lithography Double Patterning Litho-etch-Litho-Etch Litho-freeze-Litho-Etch Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing 5

  6. Two Lithography Double Patterning Problems - Expensive: two lithography steps - Overlay problem 6 https://semiengineering.com/fillcut-self-aligned-double-patterning/

  7. Self Aligned Double Patterning Nakatama, K; et al. SPIE 2012 7

  8. Conformal Deposition Step 3: Deposition of sidewall material Thickness of deposited layer is crucial Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing8

  9. Chemical Vapor Deposition (CVD) Deposition method of choice - Able to deposit on resist material and wafer - High quality - Anisotropic process - Industrially viable 9 Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing

  10. Chemical Vapor Deposition (CVD) CVD is simple and cheap High temperature Meets criteria listed before 10

  11. Etching Etch time and conditions will determine material etched - Etching too long will result in different sized features https://semiengineering.com/fillcut-self-aligned-double-patterning/11

  12. Trim Mask Issue Sidewall forms all around patterns-loops A problem if not desired Chris Mack Lecture 59 (CHE 323) Lithography Double Manufacturing12

  13. Trim Masks Use another lithography step to get rid of undesired material - Second mask - Only use to get rid of unnecessary patterns https://ieeexplore.ieee.org/document/772383013

  14. Trim Masks Overlay becomes a problem - Alignment of the second mask becomes a consideration 14 https://ieeexplore.ieee.org/document/7723830

  15. Trim Masks Second SADP Lithography step is simpler than a second LELE Lithography step - Cheaper - Less Critical https://semiengineering.com/self-aligned-double-patterning-part-one/15

  16. Self Aligned Quadruple Patterning Double SADP Doubles resolution Two trim lithography steps Nakatama, K; et al. SPIE 2012 16

  17. Self Aligned Quadruple Patterning Nakatama, K; et al. SPIE 2012 17

  18. SADP Problems Not all patterns can be printed Primary and secondary patterns can t touch https://http://www.aspdac.com/aspdac2013/archive/pdf/3C-4.pdf/18

  19. SADP Problems Anti-parallel line ends - Trim masks overlap if they are too close https://ieeexplore.ieee.org/document/7723830 19

  20. SADP Problems Turns are difficult to control - Unideal patterning results 20 https://ieeexplore.ieee.org/document/7723830

  21. SADP Problems-Via Manufacturing Via manufacturing with SADP or single patterning is not possible - Requires another double lithography technique https://ieeexplore-ieee-org.ezproxy.lib.utexas.edu/document/794001421

  22. Via Manufacturing Double manufacturing with half absorbance The common exposed areas are fully exposed 22

  23. Via Manufacturing After etching, unexposed areas form holes Holes can be filled with a conductive via material 23

  24. Via Manufacturing Via connects different layers of materials Other layers formed from other types of patterning 24

  25. In Practice MMP Patterning Technique Logic Process Production Start Company Normalized Wafer Cost Patterning Method Intel 14nm SADP 2014 193i SE 1 end of 2018 Intel 10nm SAQP 193i LELE 2.5 TSMC 16FF LELE 2015 193i LELELE 3.5 TSMC 10FF SADP 2017 193i SADP 2 TSMC 7FF SADP early 2017 193i SAQP 3 Samsung 14LP* LELE 2015 EUV SE 4 end of 2016 Samsung 10LPE LELELE EUV SADP 6 end of 2018 Samsung 8LPP LELELELE Global- Foundries 7LP SADP 2018 25

  26. Conclusions SADP along with other multiple patterning techniques will continue to be useful - Combination of multiple patterning techniques Design considerations will dominate what manufacturing method is used Future innovations in multiple patterning are required to continue Moore s Law until NGL s are feasible 26

  27. Questions? 27

  28. References Self-Aligned Double Patterning Lithography Aware Detailed Routing With Color Preassignment - IEEE Journals & Magazine, ieeexplore.ieee.org/document/7723830. Self-Aligned Double Patterning-Aware Detailed Routing with Double via Insertion and via Manufacturability Consideration - IEEE Conference Publication, ieeexplore.ieee.org/document/7544285. Fill/Cut Self-Aligned Double-Patterning. Semiconductor Engineering, semiengineering.com/fillcut-self- aligned-double-patterning/. Mack, Chris. Lecture 59 (CHE 323) Lithography Double Patterning. YouTube, YouTube, 8 Nov. 2013, www.youtube.com/watch?v=Foush3X7dCc. Nakayama, Koichi, et al. Self-Aligned Double and Quadruple Patterning Layout Principle. Search the World's Largest Collection of Optics and Photonics Applied Research., International Society for Optics and Photonics, 14 Mar. 2012, www.spiedigitallibrary.org/conference-proceedings-of-spie/8327/83270V/Self- aligned-double-and-quadruple-patterning-layout-principle/10.1117/12.916678.full. Self-Aligned Double Patterning, Part One. Semiconductor Engineering, semiengineering.com/self-aligned- double-patterning-part-one/. Triple Patterning and Self-Aligned Double Patterning (SADP). Tech Design Forum Techniques, www.techdesignforums.com/practice/guides/triple-patterning-self-aligned-double-patterning-sadp/. 28

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