Cutting-Edge Analog IPs for High-Density SRAM and GPIO
Explore the latest advancements in analog IPs showcased at AMICSA 2018, including high-density Dual Port SRAM, General Purpose IO with local POC, Voltage Monitor, and more. Dive into the details of technology, features, and specifications for these cutting-edge designs. Discover how these innovations enhance performance and reliability in semiconductor applications.
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DARE180U NEW ANALOG IPS LAURENT BERTI AMICSA 2018, LEUVEN PUBLIC
INTRODUCTION Technology and context High Density Dual Port SRAM General Purpose IO (GPIO) with local POC Voltage Monitor Power-On Reset Cristal Oscillator Extended Frequency Range PLL 11-BIT SAR ADC AMICSA 2018 2
TECHNOLOGY/CONTEXT UMC L180 MM/RF 1.8V/3.3V, Single Poly 6 Metal (1P6M), P-Sub/Twin-Well DARE180U platform/ecosystem Single Event model ELT transistor PCELL Enhanced Model (including asymmetry...). ELT aging model RAD layout rule check AMICSA 2018 3
HIGH DENSITY DUAL PORT SRAM (DARE180U_HDRAM) High Density Dual port SRAM 4096x13 bits. Clock to output available write: max. 3.8ns Clock to output available read: max. 5.3ns Use of straight transistors only. Other RAD rules (N area isolation...) enforced. Clock tree and address decoder hardened against SET. Word bit s separation of 57 m (hardening versus MBU) Designed SEL free till 80 MeV*cm2/mg Area reduction: 50% AMICSA 2018 4
GENERAL PURPOSE IO (GPIO) WITH LOCAL POC (DARE180U_GPIO) Digital input (Schmitt trigger) with programmable pull-up/pull-down Digital output (4mA drive) Analog input (serial impedance of 50 Ohms with secondary ESD protection) Analog output Designed SEL and SET free till respectively 80 and 60 MeV*cm2/mg A EN_DO_int ANA_0 Prim. Clamp Sec. Clamp ANA_50 Core 50 Ohm PAD PU PD Z PU_int PD_int EN_DI_int EN_DO EN_DI EN_DO_int EN_DI_int PU_int PD_int CTRL PU PD AMICSA 2018 5
GENERAL PURPOSE IO (GPIO) WITH LOCAL POC (DARE180U_GPIO) TR33 Local Power On Control (POC) to prevent glitches during the power ramp-up and the power ramp-down TR33 TF33 100ms VDD3V3 3.3V 2.2V VDD1V8 1.8V 1.5V 0.6V Vres33 Vres18 min 200us ~20ms ~20ms POR_RN Active POC Pull-Up 1MOhms Pull-Down 1MOhms AMICSA 2018 6
VOLTAGE MONITOR (DARE180U_VMON) 3.3V voltage monitor 3 bits to setup the detection level from 2.9V till 3.25V (step of 50mV) Glitches filtering (20 s) Designed SEL and SET free till respectively 80 and 60 MeV*cm2/mg Hysteresis Combined with BG_OK 2.9 to 3.25V by 50mV step 0 to 550 s AMICSA 2018 7
VOLTAGE MONITOR (DARE180U_VMON) 1.8V voltage monitor 3 bits to setup the detection level from 1.6V till 1.75V (step of 25mV) Glitches filtering (20 s) Designed SEL and SET free till respectively 80 and 60 MeV*cm2/mg Hysteresis Combined with BG_OK 1.6 to 1.75V by 25mV step AMICSA 2018 8
POWER-ON RESET (DARE180U_POR) 1.8V detection Programable reset pulse with external capacitor Designed SEL and SET free till respectively 80 and 60 MeV*cm2/mg Programable pulse width: - Cext = 0nF => 235 s typ - Cext = 220nF => 150ms typ AMICSA 2018 9
CRISTAL OSCILLATOR (DARE180U_XO) Frequency range: 5MHz (Rakon crystal ESCC 3501/019), 100 A typ., 18 ppm, startup time 1.4ms typ. 25MHz (Rakon crystal ESCC 3501/01/8), 450 A typ., 11 ppm, startup time 1.8ms typ. Designed SEL free till 80 MeV*cm2/mg Designed SET free till 60 MeV*cm2/mg: No double edge Max. 1.1ns phase error at 25 MHz (~2% phase error) Max. 3.8ns phase error at 5MHz (~2% phase error) AMICSA 2018 10
EXTENDED FREQUENCY RANGE PLL (DARE180U_PLL_EXT) VCO frequency range 280MHz till 400MHz Designed SEL free till 80 MeV*cm2/mg Designed SET free till 60 MeV*cm2/mg: No double edge Max. 160ps phase error @FVCO = 400 MHz Max. 600ps phase error @FVCO = 280 MHz Programmable frequency division: 8, 16, 20, 32, 40 and 80. Thermal jitter: 1ps typ up Lock Detector PLL_LOCK down PLL_PD up PLL_IN PFD CP LP VCO PLL_OUT down PLL_FB_IN Synchronous divider by N PLL_FB_OUT PLL_DIV<2:0> AMICSA 2018 11
EXTENDED FREQUENCY RANGE PLL (DARE180U_PLL_EXT) HARDENING PFD: by drive strength Synchronous divider: triplication with reset after each cycle (state-machine) Charge Pump: current limitation combined with clamp *10 *10 1 A 100ps => F = 15MHz => Vont of 15mV *10 *10 Charge 1 10 40k Vcont *10 *10 630pF Discharge 8pF *10 13k *10 1 A *10 AMICSA 2018 12
EXTENDED FREQUENCY RANGE PLL (DARE180U_PLL_EXT) HARDENING VCO: analog averaging *20 *20 *20 *20 *20 40k AMICSA 2018 13
11-BIT SAR ADC (DARE180U_ADC) 8:2 analog mux Bypass Auto zeroed differential amplifier (0dB, 6dB and 12dB). Wide input common mode Hardening: SET simulation result? 6R 4R 5R 15R INN<3> PAD Resd Sec. clamp 6R 4R 5R 15R INN<2> PAD Resd Sec. clamp 7 6R 4R 5R 15R INN<1> PAD Resd Sec. clamp 6R 4R 5R 15R INN<0> PAD Resd Sec. clamp OUTP 3 2 1 5 6 INP<0> PAD 4 OUTN Min input CM [V] Max input CM [V] | INP<i> - INN<i> | [V] Resd Sec. clamp Gain [dB] 0 6R 4R 5R 15R 0 VDDA 2 INP<0> PAD Resd Sec. clamp 6R 4R 5R 15R 6 VDDA/8 7/8*VDDA 1 8 12 3/16*VDDA 13/16*VDDA 0.5 INP<0> PAD Resd Sec. clamp 6R 4R 5R 15R INP<0> PAD Resd Sec. clamp 6R 4R 5R 15R AMICSA 2018 14
11-BIT SAR ADC (DARE180U_ADC) SAR ADC configurable in differential or single-ended mode (11-bit interface, ENOB WC of 10 bits at 300kS/s) Internal voltage reference (external capacitor free) Auto zeroed comparator Total current consumption 5mA (including analog-mux amplifier) AMICSA 2018 15
11-BIT SAR ADC (DARE180U_ADC) HARDENING Designed SEL free till 80 MeV*cm2/mg Digital hardening by: drive strength for the critical combinatorial gates Use of Hit FF Signal driving switches of the capa-bank are not hardened: the SET is filtered by the limited bandwidth Muller-C filter for the non critical signal (DataOut...) Weak Latch AMICSA 2018 16
11-BIT SAR ADC (DARE180U_ADC) HARDENING Comparator hardening: Use an auto-zeroed architecture => don t need big input transistor Comparator cross section of 80 m2 @0.1 MeV*cm2/mg for an error of 1 LSB3 3200 events (1LSB) per year on Geo worst week without shielding. Capa-bank hardening Total capa-bank switches area: 240 m2 Cunit = 12.5 fF SEU of 1 LSB correspond to 0.6 MeV*cm2/mg 10 events (1LSB) per year on Geo worst week without shielding. AMICSA 2018 17