The 31st Microelectronics Design and Test Symposium featured a virtual event discussing the implementation of multi-heuristic machine intelligence for automatic test pattern generation. The presentation covered motivation, modus operandi, experimental results, conclusions, and future works in the fi

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The lecture discusses the fundamentals of semiconductor drift and diffusion currents, diode behavior, transistor characteristics, and amplifier circuits in ECE 255. It explores the origins of modern electronics, from the invention of the bipolar transistor to the evolution of electronic devices thro

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Research conducted at IMB-CNM in collaboration with RD50 (CERN) focused on optimizing LGAD detectors through TCAD simulations. The project delved into simulation procedures, basic detector technologies, process technology, radiation hardness enhancement, HGTD and CT-PPS simulation, and conclusions d

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The MicroElec extension is a part of the Geant4-DNA framework designed for microelectronics applications, focusing on ionizing cross-section calculations for incident electrons, protons, and heavy ions. It utilizes the Complex Dielectric Function Theory (CDFT) to determine energy loss functions and

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