Matrix Measurements and Analysis After First Metal Workshop
The pilot run matrix measurements were conducted following the 7th Belle II VXD workshop and the 18th International Workshop on DEPFET Detectors and Applications by Rainer H. Richter and Paola Avella for the MPP/HLL team. The measurements included assessing defects, diode integrity, metal shorts, an
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Understanding Gated Mode Systems in Particle Detectors
Delve into the intricate details of Gated Mode systems, focusing on aspects such as theory, sensitivity areas, switcher principles, and readout processes without compromising data integrity. Explore the challenges and strategies involved in implementing Gated Mode technology effectively in DEPFET de
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DEPFET Internal Amplification vs. Oxide Thickness Simulation Study by Rainer Richter
The study explores the behavior of DEPFET internal amplification in comparison to oxide thickness through simulations conducted by Rainer Richter at the MPG Halbleiterlabor workshop. It delves into the differences in behavior between DEPFET and classical MOS transistors, shedding light on the reason
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